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Auger Peak Quantitative Analysis

Auger Peak Quantitative Analysis, Total:90 items.

In the international standard classification, Auger Peak Quantitative Analysis involves: Optical equipment, Optics and optical measurements, Analytical chemistry, Protection against fire, Electronic components in general, Testing of metals, Non-destructive testing.

General Administration of Quality Supervision, Inspection and Quarantine of the People‘s Republic of China, Auger Peak Quantitative Analysis

• GB/T 26533-2011 General rules for Auger electron spectroscopic analysis
• GB/Z 32494-2016 Analysis of Surface Chemical Analysis Auger Electron Spectroscopy Chemical Information Interpretation
• GB/T 29732-2013 Surface chemical analysis.Medium resolution Auger electron spectrometers.Calibration of energy scales for elemental analysis
• GB/T 28893-2024 Surface chemical analysis Auger electron spectroscopy and X-ray photoelectron spectroscopy Methods for determining peak intensities and information required for reporting results
• GB/T 28893-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Methods used to determine peak intensities and information required when reporting results
• GB/T 29731-2013 Surface chemical analysis.High-resolution Auger electron spectrometers.Calibration of energy scales for elemental and chemical-state analysis
• GB/T 28632-2012 Surface chemical analysis.Auger electron spectroscopy and X-ray photoelectron spectroscopy.Determination of lateral resolution
• GB/T 29558-2013 Surface chemical analysis.Auger electron spectroscopy.Repeatability and constancy of intensity scale
• GB/T 25187-2010 Surface chemical analysis.Auger electron spectroscopy.Description of selected instrumental performance parameters

American Society for Testing and Materials (ASTM), Auger Peak Quantitative Analysis

• ASTM E827-07 Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy
• ASTM E996-94(1999) Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy

SCC, Auger Peak Quantitative Analysis

• BS ISO 17973:2002 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
• BS PD ISO/TR 18394:2006 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
• BS ISO 20903:2006 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
• BS PD ISO/TR 19319:2003 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Determination of lateral resolution, analysis area, and sample area viewed by the analyser
• BS ISO 15471:2004 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
• 10/30199172 DC BS ISO 16242. Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)

Association Francaise de Normalisation, Auger Peak Quantitative Analysis

• NF ISO 17973:2006 Analyse chimique des surfaces - Spectromètres d'électrons Auger à résolution moyenne - étalonnage des échelles d'énergie pour l'analyse élémentaire
• NF ISO 24236:2006 Chemical analysis of surfaces - Auger electron spectroscopy - Repeatability and constancy of the energy scale
• NF ISO 16242:2012 Analyse chimique des surfaces - Enregistrement et notification des données en spectroscopie des électrons Auger (AES)
• NF X21-072*NF ISO 16242:2012 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES).
• NF X21-058:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results.
• NF ISO 17974:2009 Chemical Analysis of Surfaces - High Resolution Auger Electron Spectrometers - Calibration of Energy Scales for Elemental and Chemical State Analysis
• NF X21-067*NF ISO 17974:2009 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis.

International Organization for Standardization (ISO), Auger Peak Quantitative Analysis

• ISO/CD 17973 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
• ISO 20903:2011 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Methods used to determine peak intensities and information required when reporting results
• ISO/TR 18394:2016 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
• ISO/TR 18394:2006 Surface chemical analysis - Auger electron spectroscopy - Derivation of chemical information
• ISO 20903:2019 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Methods used to determine peak intensities and information required when reporting results
• ISO/DIS 17973:2023 Surface chemical analysis — Medium-resolution Auger electron spectrometers — Calibration of energy scales for elemental analysis
• ISO 15471:2016 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
• ISO 15471:2004 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
• ISO 16242:2011 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
• ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
• ISO 18118:2024 Surface chemical analysis — Auger electron spectroscopy and X-ray photoelectron spectroscopy — Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis

國家市場監(jiān)督管理總局、中國國家標準化管理委員會, Auger Peak Quantitative Analysis

• GB/T 29732-2021 Surface chemical analysis—Medium resolution auger electron spectrometers—Calibration of energy scales for elemental analysis
• GB/T 16840.3-2021 Technical determination methods for electrical fire evidence—Part 3: Auger electron spectroscopy component analytic method
• GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy

Professional Standard - Electron, Auger Peak Quantitative Analysis

• SJ/T 10457-1993 Standard guide for depth profiling auger electron spectroscopy

British Standards Institution (BSI), Auger Peak Quantitative Analysis

• BS ISO 17973:2016 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
• BS ISO 20903:2011 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
• PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
• BS ISO 20903:2019 Surface chemical analysis. Auger electron spectroscopy and X-ray photoelectron spectroscopy. Methods used to determine peak intensities and information required when reporting results
• BS PD ISO/TR 18394:2016 Surface chemical analysis. Auger electron spectroscopy. Derivation of chemical information
• 23/30469291 DC BS ISO 17973. Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis
• BS ISO 15471:2005 Surface chemical analysis - Auger electron spectroscopy - Description of selected instrumental performance parameters
• BS ISO 16242:2011 Surface chemical analysis. Recording and reporting data in Auger electron spectroscopy (AES)
• BS ISO 17974:2002(2010) Surface chemical analysis — High - resolution Auger electron spectrometers — Calibration of energy scales for elemental and chemical - state analysis
• BS ISO 18516:2006(2010) Surface chemical analysis — Auger electron spectroscopy and X - ray photoelectron spectroscopy — Determination of lateral resolution
• BS ISO 18516:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Determination of lateral resolution
• BS ISO 15471:2016 Surface chemical analysis. Auger electron spectroscopy. Description of selected instrumental performance parameters
• BS ISO 24236:2005 Surface chemical analysis - Auger electron spectroscopy - Repeatability and constancy of intensity scale

BSI, Auger Peak Quantitative Analysis

• BS ISO 17973:2024 Surface chemical analysis. Medium-resolution Auger electron spectrometers. Calibration of energy scales for elemental analysis

中華人民共和國國家質(zhì)量監(jiān)督檢驗檢疫總局、中國國家標準化管理委員會, Auger Peak Quantitative Analysis

• GB/T 35158-2017 Verification method for Auger electron spectrometers(AES)
• GB/T 32565-2016 Surface chemical analysis—Recording and reporting data in Auger electron spectroscopy (AES)

Standard Association of Australia （SAA）, Auger Peak Quantitative Analysis

• ISO 17973:2024 Surface chemical analysis - Medium-resolution Auger electron spectrometers - Calibration of energy scales for elemental analysis
• AS ISO 17974:2006 Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis
• AS ISO 18118:2006 Surface chemical analysis - Auger electron spectroscopy and X-ray photoelectron spectroscopy - Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

GSO, Auger Peak Quantitative Analysis

• GSO ISO/TR 18394:2021 Surface chemical analysis — Auger electron spectroscopy — Derivation of chemical information
• BH GSO ISO 20903:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Methods used to determine peak intensities and information required when reporting results
• OS GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
• BH GSO ISO 17973:2016 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
• GSO ISO 17973:2013 Surface chemical analysis -- Medium-resolution Auger electron spectrometers -- Calibration of energy scales for elemental analysis
• GSO ISO 16242:2015 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
• BH GSO ISO 16242:2017 Surface chemical analysis -- Recording and reporting data in Auger electron spectroscopy (AES)
• OS GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
• BH GSO ISO 18516:2016 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
• GSO ISO 18516:2013 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Determination of lateral resolution
• OS GSO ISO 17974:2014 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
• BH GSO ISO 17974:2016 Surface chemical analysis -- High-resolution Auger electron spectrometers -- Calibration of energy scales for elemental and chemical-state analysis
• BH GSO ISO 29081:2016 Surface chemical analysis -- Auger electron spectroscopy -- Reporting of methods used for charge control and charge correction

Korean Agency for Technology and Standards (KATS), Auger Peak Quantitative Analysis

• KS D ISO 15471-2005(2020) Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
• KS D ISO 15471:2005 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
• KS D ISO 17973-2021 Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
• KS D ISO 17973-2011(2016) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
• KS D ISO 17973-2011(2021) Surface chemical analysis－Medium-resolution Auger electron spectrometers－Calibration of energy scales for elemental analysis
• KS D ISO 15471-2020 Surface chemical analysis－Auger electron spectroscopy－Description of selected instrumental performance parameters
• KS D ISO 19319-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Determination of lateral resolution, analysis area, and sample area viewed by the analyzer
• KS D ISO 17974-2021 Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
• KS D ISO 17974-2011(2016) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
• KS D ISO 18118-2020 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials
• KS D ISO 18118-2005(2020) Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of h
• KS D ISO 17974-2011(2021) Surface chemical analysis－High-resolution Auger electron spectrometers－Calibration of energy scales for elemental and chemical-state analysis
• KS D ISO 18118:2005 Surface chemical analysis－Auger electron spectroscopy and X-ray photoelectron spectroscopy－Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Japanese Industrial Standards Committee (JISC), Auger Peak Quantitative Analysis

• JIS K 0161:2010 Surface chemical analysis -- Auger electron spectroscopy -- Description of selected instrumental performance parameters
• JIS K 0167:2011 Surface chemical analysis -- Auger electron spectroscopy and X-ray photoelectron spectroscopy -- Guide to the use of experimentally determined relative sensitivity factors for the quantitative analysis of homogeneous materials

Professional Standard - Machinery, Auger Peak Quantitative Analysis

• JB/T 6976-1993 Auger Electron Spectroscopy Element Identification Method

未注明發(fā)布機構(gòu), Auger Peak Quantitative Analysis

• DIN ISO 16242 E:2019-10 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES)
• AS ISO 17974:2006(R2016) Surface chemical analysis - High-resolution Auger electron spectrometers - Calibration of energy scales for elemental and chemical-state analysis

German Institute for Standardization, Auger Peak Quantitative Analysis

• DIN ISO 16242:2020-05 Surface chemical analysis - Recording and reporting data in Auger electron spectroscopy (AES) (ISO 16242:2011); Text in English

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